Surface Analysis
Surface properties such as roughness and contamination are a critical aspect of composite materials during adhesive bonding, co-curing or even welding of different components. UQ Composites has acquired extensive experience in film surface characterisation through the use of stereo microscopy and Atomic Force Microscopy (AFM) for physical properties; Scanning Electron Microscopy with Energy Dispersive X-rays (SEM-EDX) and X-ray Photoelectron Spectroscopy (XPS) for chemical composition and surface contamination analysis.
The combination of these high-precision techniques allows to detect key differences in the chemical composition of the first few atomic layers, which are found to affect the performance of the bonded joints.
Interface Analysis
The extent of interdiffusion at the interface between two dissimilar materials typically occurs on a micro or sub-micrometre scale and is often difficult to characterise. However, the morphology of these interfaces provide valuable information on the compatibility of the two polymers and consequently of the mechanical performance of the interface. Interface characterization is part of UQ Composites’ expertise.
The mechanical properties of the interface can be obtained via phase imaging of Atomic Force Microscopy (AFM) in tapping mode, and combined with a chemical composition analysis across the interface using Scanning Electron Microscopy with Energy Dispersive X-rays (SEM-EDX). These provide the necessary information for predicting interface behaviours.